Atomic Force Microscope
The Dimension 5000 scanning probe microscope provides users with the ultimate automated tool for large-sample metrology and imaging. This SPM is capable of measuring up to one hundred areas on samples up to 350mm in diameter. A comprehensive range of AFM and STM techniques enables the Dimension 5000 to detect faults and measure roughness and other features in three dimensions without any sample destruction, pretreatment, or modification. The Dimension 5000 system features an XYZ scanning head that offers up to six times lower Z sensor noise and four times faster scanning than any other closed-loop system available.